NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Zn₀.₂₀₃Ge₀.₄₀₁P₀.₃₂₈

Name:

zinc germanium phosphide

CAS Registry No:

12025-31-9

Class:

II-VI semiconductor, phosphide

Citation:

Author Name(s):

Kuhn W.K.

Journal:

Surf. Sci. Spectra 3, 93

DOI:

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Photoelectron Line

186.50

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

2.1

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode. Emission angle = 45 degrees. The sample was cleaned by Ar+ ion bombardment (Ep = 3.5 keV, Ip = 0.0025 mA, angle of incidence = 40 degrees).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

298