NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Tab Page Summary
General:
Ta
Ta
tantalum
7440-25-7
element
Citation:
Riffe D.M., Hale W., Kim B., Erskine J.L.
Phys. Rev. B 51, 11012
Pub Year:
1995
Data Processing:
Surface Core-level Shift for the Second Layer of Atoms
SS2-4f7/2
0.005
mixed Gaussian/Lorentzian
0.362
0.140
Measurement:
Anode Material:
other source
X-ray Energy:
70, 100
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The sample was cleaned by repeated annealing to 2850 K. Peak locations: Doniach - Sunjic & Gaussian. Singularity index = 0.205.
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
80