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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
O
Formula:
(Ag2O)0.50(TeO2)0.10(P2O5)0.40
XPS Formula:
bridging oxygen
Name:
disilver(I) oxide tellurium(IV) dioxide diphosphorus(V) pentoxide (bridging oxygen) ((Ag2O)0.50(TeO2)0.10(P2O5)0.40)
CAS Registry No:
Class:
chalcogenide, glass, oxide

Citation:
Author Name(s):
Chowdari B.V.R., Kumari P.P.
Journal:
J. Non-cryst. Solids 197, 31
DOI:
Pub Year:
1996

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
532.60
Energy Uncertainty:
0.1
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The glass was prepared from the reagent grade AgNO3, TeO2 and NH4H2PO4. The intensity ratio of the non-bridging/bridging oxygen components was 0.61. FAT mode.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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