NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(Ag₂O)₀.₅₀(TeO₂)₀.₄₀(P₂O₅)₀.₁₀

XPS Formula:

TeO₃(₂^-) species

Name:

disilver(I) oxide tellurium(IV) dioxide diphosphorus(V) pentoxide ((Ag2O)0.50(TeO2)0.40(P2O5)0.10)

CAS Registry No:

Class:

chalcogenide, glass, oxide

Citation:

Author Name(s):

Chowdari B.V.R., Kumari P.P.

Journal:

J. Non-cryst. Solids 197, 31

DOI:

Pub Year:

1996

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

572.70

0.1

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The glass was prepared from the reagent grade AgNO3, TeO2 and NH4H2PO4.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300