There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
zinc sulfide
chalcogenide, mineral, sulfide

Citation:
Ban D., Yang F., Fang R., Xu S., Xu P.
J. Electron Spectrosc. Relat. Phenom. 80, 197
Pub Year:
1996

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
other source
X-ray Energy:
100
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
ZnS(111). The sample was cleaned by Ar+ ion bombardment (Ep = 900 eV, time = 10 min) and subsequently annealed (T = 673 K, time = 12 min) for several cycles.

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙