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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
underlayer component
tungsten
element

Citation:
Jupille J., Purcell K.G., King D.A.
Surf. Sci. 367, 149
Pub Year:
1996

Data Processing:
Surface Core-level Shift for the Second Layer of Atoms
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
other source
X-ray Energy:
75
Overall Energy Resolution (eV):
0.22
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
W(100)c(2x2). The sample was leaned by repeated heating to 1800 K in 1E-6 Torr O2 and flashing in vacuum to 2400 K. Peak locations: Doniach - Sunjic & Gaussian.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300

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