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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
cadmium sulfide
chalcogenide, II-VI semiconductor, IV-VI semiconductor, mineral, organometallic, sulfide

Citation:
Hashimoto Y., Takeuchi K., Ito K.
Appl. Phys. Lett. 67, 980
Pub Year:
1995

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
~ 100 nm CdS/p-type Si(111).

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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