NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

InSe

indium selenide

1312421

chalcogenide, II-VI semiconductor, III-V semiconductor, selenide

Citation:

Author Name(s):

Nelson A.J.

Journal:

J. Appl. Phys. 78, 5701

DOI:

Pub Year:

1995

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4d_5/2

17.40

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.2

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The film with thickness of 480 nm was deposited on GaAs(100) substrate by PVD (T = 773 - 823 K). The spectra were recorded at normal emission.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300