NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Zr₁.₀₂Si₀.₉₆Te₁.₀₂

Name:

zirconium silicon tellurium imc

CAS Registry No:

Class:

intermetallic

Citation:

Author Name(s):

Bensch W., Helmer O., Muhler M., Ebert H., Knecht M.

Journal:

J. Phys. Chem. 99, 3326

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Photoelectron Line

98.90

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

FAT mode.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300