NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Nb

NbN

Niobium nitride

CAS Registry No:

24621-21-4

nitride

Citation:

Author Name(s):

Johansson L.I., Johansson H.I.P.

J. Electron Spectrosc. Relat. Phenom. 80, 237

Pub Year:

1996

bookAll Records in this Publication

Data Processing:

Surface Core-level Shift

Line Designation:

SS-3d_5/2

Surface Core-Level Shift (eV)

0.49

Energy Uncertainty:

0.02

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

0.160

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

260-340

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

NbN(100)-(1x1). The sample was cleaned by cycles of Ar+ ion bombardment and flashings (T= ~1273 K) in N2 atmosphere (p = 1E-4 torr). The spectra were recorded at normal emission. Asymmetry parameter = 0.15. The Gaussian FWHM was varied from 0.32 eV at 240 eV photon energy to 0.40 eV at 400 eV.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

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