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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
N
Formula:
NbN
Name:
Niobium nitride
CAS Registry No:
24621-21-4
Class:
nitride

Citation:
Author Name(s):
Johansson L.I., Johansson H.I.P.
Journal:
J. Electron Spectrosc. Relat. Phenom. 80, 237
DOI:
Pub Year:
1996

Data Processing:
Data Type:
Surface Core-level Shift
Line Designation:
SS-1s
Surface Core-Level Shift (eV)
-0.53
Energy Uncertainty:
0.04
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
0.250

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
440-470
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
NbN(100)-(1x1). The sample was cleaned by cycles of Ar+ ion bombardment and flashings (T= ~1273 K) in N2 atmosphere (p = 1E-4 torr). The spectra were recorded at normal emission. Asymmetry parameter = 0.06. The Gaussian FWHM was varied from 0.47 eV at 435 eV photon energy to 0.55 eV at 520 eV.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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