NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

niobium

7440-03-1

element, rare earth

Citation:

Author Name(s):

Lo W.-S., Chien T.-S., Tsan C.-C., Fang B.-S.

Journal:

Phys. Rev. B 51, 14749

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS2-3d_5/2

Surface Core-Level Shift (eV) for the second Layer of Atoms

0.13

Energy Uncertainty:

0.010

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.200

Lorentzian Width (eV):

0.180

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

240, 250

Overall Energy Resolution (eV):

0.25

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Nb(001). Peak locations: Doniach - Sunjic & Gaussian. Asymmetry parameter = 0.14.

Specimen:

Method of Determining Specimen Composition:

Auger Electron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

130