NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 2

Surface Core-level Shift for the Second Layer of Atoms

SS2-3d_5/2

0.13

0.010

Shirley

mixed Gaussian/Lorentzian

0.200

0.180

Yes

Anode Material:

other source

X-ray Energy:

240, 250

Overall Energy Resolution (eV):

0.25

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Nb(001). Peak locations: Doniach - Sunjic & Gaussian. Asymmetry parameter = 0.14.

Method of Determining Specimen Composition:

Auger Electron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

130