NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

In

CuInSe₂

copper indium selenide

CAS Registry No:

12018-95-0

chalcogenide, II-VI semiconductor, selenide

Citation:

Author Name(s):

Nelson A.J., Frigo S.P., Rosenberg R.

J. Vac. Sci. Technol. A 13, 1990

Pub Year:

1995

bookAll Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

4d_3/2

Binding Energy (eV)

18.80

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

70, 110

Overall Energy Resolution (eV):

0.5

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

n-CuInSe2(112). The sample was cleaned by Ar+ ion bombardment (Ep = 500 eV, angle of incidence = 30 degrees) and annealing (T = 773 K, time = ~ 2 min).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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