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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Se
Formula:
GeSe2
Name:
germanium diselenide
CAS Registry No:
12065-11-1
Class:
chalcogenide, glass, II-VI semiconductor, IV-VI semiconductor, selenide

Citation:
Author Name(s):
Kandil K.M., Kotkata M.F., Theye M.L., Gheorghiu A., Senemaud C., and Dixmier J.
Journal:
Phys. Rev. B 51, 17565
DOI:
Pub Year:
1995

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d5/2
Binding Energy (eV)
54.50
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
1.1
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
0.5
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The film was deposited by rapid thermal evaporation of the powdered glass.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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