NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

GeSe₂

germanium diselenide

12065-11-1

chalcogenide, glass, II-VI semiconductor, IV-VI semiconductor, selenide

Citation:

Author Name(s):

Kandil K.M., Kotkata M.F., Theye M.L., Gheorghiu A., Senemaud C., and Dixmier J.

Journal:

Phys. Rev. B 51, 17565

DOI:

Pub Year:

1995

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

55.30

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.1

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.5

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The film was deposited by rapid thermal evaporation of the powdered glass.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300