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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
In2Te3
indium (III) telluride
chalcogenide, II-VI semiconductor, telluride

Citation:
Tkalich A.K., Demin V.N., Zlomanov V.P.
J. Solid State Chem. 116, 33
Pub Year:
1995

Data Processing:
Chemical Shift
CS-AP-3d5/2,M4N45N45

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag3d5 = 368.27
Charge Reference:
Element
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The sample was cleaned by Ar+ ion bombardment (Ep = 800 eV).

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300

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