NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 14

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

H₂/Sn/Pt

DS-4d

1.04

Sn/Pt

DS-4d

1.04

Sn/Pt

4f_7/2

70.73

Sn/Pt

4d_5/2

25.22

Sn/Pt

4d_5/2

24.77

4f_7/2

70.61

H₂/Sn/Pt

4f_7/2

70.76

H₂/Sn/Pt

4f_7/2

71.57

H₂/Sn/Pt

4d_5/2

25.27

H₂/Sn/Pt

4d_5/2

24.78

H₂/Sn/Pt

SS-4f_7/2

0.59

H₂/Sn/Pt

SS-4f_7/2

-0.22

SS-4f_7/2

-0.37

Sn/Pt

SS-4f_7/2

-0.25

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4f_7/2

Surface Core-Level Shift (eV)

-0.22

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.15

Lorentzian Width (eV):

0.44

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

125

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

150 L H2/Pt(111)-(R3xR3)R30 degrees-Sn. The Sn coverage was ~1/3 ML. Singularity index = 0.12. The relative intensity was 0.26. The spectra were recorded at normal emission.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

193