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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Sn
Formula:
Sn/Pt
Name:
tin/platinum
CAS Registry No:
7440-31-5
Class:
element

Citation:
Author Name(s):
Janin E., Bjorkqvist M., Grehk T.M., Gothelid M., Pradier C.-M., et al.
Journal:
Appl. Surf. Sci. 99, 371
DOI:
Pub Year:
1996

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4d5/2
Binding Energy (eV)
25.22
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.089
Lorentzian Width (eV):
0.26

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
70
Overall Energy Resolution (eV):
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Pt(111)-(R3xR3)R30 degrees-Sn. The Sn coverage was ~1/3 ML. Singularity index = 0.04. The relative intensity was 0.97. Branching ratio = 0.69. The spectra were recorded at normal emission.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
193
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