NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 7

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

InN

15.74

GaN

157.69

GaN

3p_1/2

106.10

GaN

3p_3/2

102.47

GaN

17.02

AlN

115.48

AlN

70.44

Data Processing:

Photoelectron Line

70.44

0.04

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

Al/Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was grown on (0001) 6H-SiC and (0001) saphire substrates at 823 K. The wurtzite crystal structure. (1x1) RHEED pattern.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Reflection High-Energy Electron Diffraction

Specimen Temperature (K):

300