NIST X-ray Photoelectron Spectroscopy Database

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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-CH₂(CH₂)₂CH₂O^-)n

XPS Formula:

carbon atoms attached to O

Name:

poly(tetrahydrofuran)

CAS Registry No:

25190-06-1

Class:

ether, oxygen, polymer

Citation:

Author Name(s):

Boulanger P., Pireaux J.J., Verbist J.J., Delhalle J.

Journal:

Polymer 35, 5185

DOI:

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Photoelectron Line

286.10

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

An electron flood gun (Ep < 4 eV, Ip < 1 mA) was used for charge compensation. The C/O intensity ratio determined by XPS was 3.88.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

263