NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

InP

indium phosphide

22398-80-7

II-VI semiconductor, III-V semiconductor, phosphide

Citation:

Author Name(s):

Baker S.H., Bayliss S.C., Gurman S.J., Elgun N., Davis E.A.

Journal:

J. Phys. Cond. Matter 8, 1591

DOI:

Pub Year:

1996

bookAll Records in this Publication

Data Processing:

Photoelectron Line

127.50

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.8

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300