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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
iron sulfide
12068-85-8
chalcogenide, sulfide

Citation:
Chaturvedi S., Katz R., Guevremont J., Schoonen M.A.A., Strongin D.R.
Am. Mineral. 81, 261
Pub Year:
1996

Data Processing:
Photoelectron Line
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
FeS2(100). The composition determined by XPS was FeS1.9. The sample was cleaned by He+ ion bombardment (Ep = 200 eV, time = ~10 min) and annealed (T = 573 K, time = ~5 min). The intensity ratio of the Gaussian/Lorentzian components was 80/20. Branching ratio = 0.5. FAT mode.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300

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