NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 2

Data Processing:

Photoelectron Line

2p_1/2

163.50

0.3

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.3

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

FeS2(100). The composition determined by XPS was FeS1.9. The sample was cleaned by He+ ion bombardment (Ep = 200 eV, time = ~10 min) and annealed (T = 573 K, time = ~5 min). The intensity ratio of the Gaussian/Lorentzian components was 80/20. Branching ratio = 0.5. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300