NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

SnO₂

tin(IV) dioxide

18282-10-5

anhydride, oxide

Citation:

Author Name(s):

Suzer S., Voscoboinikov T., Hallam K.R., Allen G.C.

Journal:

Fres. J. Anal. Chem. 355, 654

DOI:

Pub Year:

1996

bookAll Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

487.30

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was SnO1.66.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Photoelectron Spectroscopy

Specimen Temperature (K):

300