NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

SnO₂

tin(IV) dioxide

18282-10-5

anhydride, oxide

Citation:

Author Name(s):

Di Giulio M., Serra A., Tepore A., Rella R., Siciliano P., and Mirenghi L.

Journal:

Mater. Sci. Forum 203, 143

DOI:

Pub Year:

1996

bookAll Records in this Publication

Data Processing:

Photoelectron Line

530.94

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300