NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(^-CH₂O^-)n

(^-C*H₂O^-)n

poly(oxymethylene)

9015-98-9

ether, oxygen, polymer

Citation:

Author Name(s):

Boulanger P., Riga J., Delhalle J., Verbist J.J.

Journal:

Polymer 29, 797

DOI:

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

288.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Co-condensed hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

283