NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

XPS Formula:

C atoms in carbonyl groups

Name:

poly(ethyleneterephtalate)

CAS Registry No:

122987-74-0

Class:

ester, phenyl benzene, polymer

Citation:

Author Name(s):

Chtaib M., Roberfroid E.M., Novis Y., Pireaux J.J., Caudano R.,Lutgen P., et al.

Journal:

J. Vac. Sci. Technol. A 7, 3233

DOI:

Pub Year:

1989

book All Records in this Publication

Data Processing:

Photoelectron Line

288.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300