NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

AlSb

Al*Sb

aluminum stibnide

25152-52-7

III-V semiconductor, stibnide

Citation:

Author Name(s):

Gualtieri G.J., Schwartz G.P., Nuzzo R.G., Sunder W.A.

Journal:

Appl. Phys. Lett. 49, 1037

DOI:

Pub Year:

1986

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

72.96

0.025

Background Subtraction Method:

Linear

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was grown at a substrate temperature of 763 K

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300