NIST X-ray Photoelectron Spectroscopy Database

The XPS web application is currently unavailable due to a system issue affecting communication between the web server and the database.

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(^-C₆H₃(HS)^-)n

^-C₆H₄S*^-

poly(benzenethiol)

9016-75-5

phenyl benzene, polymer, sulfur, thiol

Citation:

Author Name(s):

Kaul A.

Journal:

Polymer Preprints 28, 229

Pub Year:

1987

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

164.10

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.0

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300