NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-CH₂CH(C(O)NH₂)^-)n/Al₂O₃.3H₂O

XPS Formula:

(^-CH₂CH(C(O)N*H₂)^-)n/Al₂O₃.3H₂O

Name:

poly(acrylamide)/dialuminum(III) trioxide trihydrate

CAS Registry No:

9003-05-8

Class:

amide, hydrate, mineral, nitrogen, oxide, polymer

Citation:

Author Name(s):

Sugama T., KuKacka L.E., Carciello N., Hocker N.J.

Journal:

Cement and Concrete Research 19, 857

DOI:

Pub Year:

1989

bookAll Records in this Publication

Data Processing:

Photoelectron Line

399.60

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Poly(acrylic acid)/gibbsite.Thin layer of polymer, no thicker than 5 nm, which corresponds to the escape depth of the aluminium photoelectrons.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300