NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

HOC(O)CH(NH₂)CH₂SSCH₂CH(NH₂)C(O)OH

XPS Formula:

HOC(O)CH(NH₂)CH₂S*S*CH₂CH(NH₂)C(O)OH

Name:

DL-cystine

CAS Registry No:

923-32-0

Class:

amine, amino acid/its derivatives, carboxylic acid, nitrogen, organic acid, oxygen, sulfur

Citation:

Author Name(s):

Kelemen S.R., George G.N., Gorbaty M.L.

Journal:

Fuel 69, 939

DOI:

Pub Year:

1990

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

163.20

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):