NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

WS₂

W*S₂

tungsten disulfide

12138-09-9

catalyst, chalcogenide, IV-VI semiconductor, sulfide

Citation:

Author Name(s):

Startsev A.V., Shkuropat S.A., Zaikovskii V.I., Moroz E.M., Yermakov Y.I., Plaksin G.V. et al

Journal:

Kinet. Katal. 29, 398

Pub Year:

1988

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

32.80

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300