NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CdTe

CdTe*

cadmium telluride

1306-25-8

chalcogenide, II-VI semiconductor, IV-VI semiconductor, telluride

Citation:

Author Name(s):

Sporken R., Sivananthan S., Reno J., Faurie J.P.

Journal:

J. Vac. Sci. Technol. B 6, 1204

DOI:

Pub Year:

1988

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Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4d

Surface Core-Level Shift (eV)

0.48

Energy Uncertainty:

0.075

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.7

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

CdTe(111) B surface. The energy is referenced to the bulk state of the Te4d line

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300