NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₆H₅^-N(H)^-C(CH₃)=C(CN)^-C(S)^-S^-CH₂^-C(O)^-O^-C₂H₅

XPS Formula:

C₆H₅^-N*(H)^-C(CH₃)=C(CN)^-C(S)^-S^-CH₂^-C(O)O^-C₂H₅

Name:

3-phenylamino-3-methyl-2-cyano-dithioacrylic acid ethoxycarbonylmethyl ester

CAS Registry No:

Class:

(iso)cyanide, ester, nitrogen, oxygen, phenyl benzene, sulfur

Citation:

Author Name(s):

Hartung J., Weber G., Beyer L., Szargan R., Kreutzmann J.

Journal:

Z. Anorg. Allg. Chem. 543, 186

Pub Year:

1986

bookAll Records in this Publication

Data Processing:

Photoelectron Line

399.80

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300