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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
N
Formula:
[(C2H5)4N]2[Rh2((C4H8N)C(O)O)2((C4H7N)C(O)O)2]
XPS Formula:
[(C2H5)4N*]2[Rh2((C4H8N)C(O)O)2((C4H7N)C(O)O)2]
Name:
bis(tetraethylammonium)tetra-mu-prolinatodirhodate
CAS Registry No:
Class:
organometallic

Citation:
Author Name(s):
Bontcev P.R., Miteva M., Zhecheva E., Mechanjiev D., Pneumatikakis G., Angelopoulos C.
Journal:
Inorg. Chim. Acta 152, 107
DOI:
Pub Year:
1988

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
401.60
Energy Uncertainty:
0.15
Background Subtraction Method:
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
180
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