NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₆H₅OC(O)CH₂(O)(CF₂)₃CH₂(O)C(O)OC₆H₅

XPS Formula:

C₆H₅OC(O*)CH₂(O)(CF₂)₃CH₂(O)C(O)OC₆H₅

Name:

2,2,3,3,4,4-hexafluoro-1,5-phenylate-1,5-pentanediyl

CAS Registry No:

74832192

Class:

fluoride, halogenated compound, oxygen, phenyl benzene

Citation:

Author Name(s):

Clark D.T., Feast W.J., Tweedale P.J., Thomas H.R.

Journal:

J. Polym. Sci. Polym. Chem. Ed. 18, 1651

DOI:

Pub Year:

1980

bookAll Records in this Publication

Data Processing:

Photoelectron Line

533.50

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):