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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
O2/GaAs
As*Ox Oxide state
oxygen/gallium arsenide
arsenic, arsenide, element, III-V semiconductor, IV-VI semiconductor, non-stoichiometric oxide, oxide

Citation:
Weber E.-H., Flamm D., Meisel A.
J. Electron Spectrosc. Relat. Phenom. 47, 39
Pub Year:
1988

Data Processing:
Chemical Shift
other type of curve fit

Measurement:
Anode Material:
other anode
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
1.0E7 L O2/GaAs. Chemical shift is related to uncoordinated As

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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