NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C₆H₄F₂

1,2-difluoro-benzene

367113

fluoride, halogenated compound, phenyl benzene

Citation:

Author Name(s):

Clark D.T., Kilcast D., Adams D.B., Musgrave W.K.R.

Journal:

J. Electron Spectrosc. Relat. Phenom. 1, 232

DOI:

Pub Year:

1972

bookAll Records in this Publication

Data Processing:

Photoelectron Line

288.20

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):