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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
SiO2,quartz
Name:
silicon(IV) dioxide (Quartz)
CAS Registry No:
60676-86-0
Class:
glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:
Author Name(s):
Klasson M., Berndtsson A., Hedman J., Nilsson R., Nyholm R., Nordling C.
Journal:
J. Electron Spectrosc. Relat. Phenom. 3, 427
DOI:
Pub Year:
1974

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
1843.80
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
CrK,Au3d5-4f7=2122.9
Charge Reference:
Conductor
Energy Scale Evaluation:
One-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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