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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
SiO2,quartz
silicon(IV) dioxide (Quartz)
60676-86-0
glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:
Barr T.L.
Appl. Surf. Sci. 15, 1
Pub Year:
1983

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with three-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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