There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
O
Formula:
SiO2,quartz
Name:
silicon(IV) dioxide (Quartz)
CAS Registry No:
60676-86-0
Class:
glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:
Author Name(s):
Cimino A., Gazzoli D., Inversi M., Valigi M.
Journal:
Surf. Interface Anal. 10, 194
DOI:
Pub Year:
1987

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
533.00
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
*
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
An error has occurred. This application may no longer respond until reloaded. Reload 🗙