There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
O
Formula:
TeO2
Name:
tellurium(IV) dioxide
CAS Registry No:
7446-07-3
Class:
chalcogenide, oxide

Citation:
Author Name(s):
Garbassi F., Bart J.C.J., Petrini G.
Journal:
J. Electron Spectrosc. Relat. Phenom. 22, 95
DOI:
Pub Year:
1981

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
530.40
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
An error has occurred. This application may no longer respond until reloaded. Reload 🗙