NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Na₂[W(O)W(O)(muO)(muO)(mu(O(O)CCH₂)₂NCH₂CH₂N(CH₂C(O)O)₂)]

XPS Formula:

Na₂[W*(O)W*(O)(muO)(muO)(mu(O(O)CCH₂)₂NCH₂CH₂N(CH₂C(O)O)₂)]

Name:

disodium bis(mu-oxo)(mu-N,N'-ethylenediaminetetraacetato) bis(oxotungstate)

CAS Registry No:

Class:

acetate, alkali, amide, cluster, ethylenediaminetetraacetate, organometallic, tungstate

Citation:

Author Name(s):

Ikari S., Sasaki Y., Nagasawa A., Kabuto C., Ito T.

Journal:

Inorg. Chem. 28, 1248

DOI:

Pub Year:

1989

bookAll Records in this Publication

Data Processing:

Photoelectron Line

4d_5/2

246.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Samples were prepared as thin films on Al.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300