NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-CSC(S)NHC(O)^-)C(C₂H₅)CH(^-CSe(C₆H₄)N(CH₃)^-)

XPS Formula:

(^-CSC(S)NHC(O*)^-)C(C₂H₅)CH(^-CSe(C₆H₄)N(CH₃)^-)

Name:

5-(1-((3-methyl-2(3H)-benzoselenazolylidene)methyl)propylidene)-2-thioxo-4-thiazolidinone

CAS Registry No:

112750488

Class:

amine, ketone, nitrogen, other ring, oxygen, phenyl benzene, selenide, sulfur

Citation:

Author Name(s):

Chehimi M.M., Delamar M.

Journal:

J. Electron Spectrosc. Relat. Phemon. 50, c25

DOI:

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Photoelectron Line

531.60

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):