NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-C(O)C(CH₂OC₁₆H₃₃)CHC(NO₂)CHC^-)CHCH(^-CSe(C₆H₄)N(CH₃)^-)

XPS Formula:

(^-C(O*)C(CH₂OC₁₆H₃₃)CHC(NO₂)CHC^-)CHCH(^-CSe(C₆H₄)N(CH₃)^-)

Name:

6-((1-hexadecioxy)methyl)-6-((3-methyl-2(3H)-benzoselenazoylidene)ethylidene)-2-nitro-2,4-cyclohexadien-1-one

CAS Registry No:

124251929

Class:

imide, ketone, nitrogen, other ring, oxygen, phenyl benzene, selenide

Citation:

Author Name(s):

Chehimi M.M., Delamar M.

Journal:

J. Electron Spectrosc. Relat. Phemon. 50, c25

DOI:

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Photoelectron Line

530.90

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):