NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

C₆H₄(N((CH₂)₃SO₃Na)C(CHCHCHCH(CC(O)N((CH₂)₃CH₃)C(S)N((CH₂)₃CH₃)C(O))O)^-)

XPS Formula:

C=O*

Name:

sodium 2-(4-(1,3-dibutyltetrahydro-4,6-dioxo-2-thioxo-5(2H)-pyrimidinylidene)-2-butenylidene)-3(2H)-benzoxazolepropane sulfonate

CAS Registry No:

62796230

Class:

alkali, amine, azole, ketone, nitrogen, oxygen, phenyl benzene, sulfate, sulfur

Citation:

Author Name(s):

Chehimi M.M., Delamar M.

Journal:

J. Electron Spectrosc. Relat. Phemon. 50, c25

DOI:

Pub Year:

1990

book All Records in this Publication

Data Processing:

Photoelectron Line

531.20

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):