NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(^-C₆H₅NH^-)n

film, KOH treated

poly(aniline)

25233-30-1

amine, aniline, nitrogen, phenyl benzene, polymer

Citation:

Author Name(s):

Kumar S.N., Bouyssoux G., Gaillard F.

Journal:

Surf. Interface Anal. 15, 531,

DOI:

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Photoelectron Line

401.30

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):