NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Ni(SC(SCH₃)CHC(C₆H₅)O)₂]

XPS Formula:

[Ni(S*C(SCH₃)CHC(C₆H₅)O)₂]

Name:

bis(methyl beta-oxobenzenepropane(dithioato-O,S'))nickel

CAS Registry No:

69087656

Class:

organometallic, oxygen, phenyl benzene, sulfur

Citation:

Author Name(s):

Beyer L., Kirmse R., Stach J., Szargan R., Hoyer E.

Journal:

Z. Anorg. Allg. Chem. 476, 7

DOI:

Pub Year:

1981

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

163.00

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):