NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Rh₂(CH₃COS)₄((CH₃)₂SO)₂]

Name:

tetrakis(mu-(thioacetato-O,S))bis(sulfinylbis(methyl)-O)dirhodium

CAS Registry No:

73128286

Class:

ethanethioato, organometallic, sulfinyl(organic), sulfur

Citation:

Author Name(s):

Nefedov V.I., Salyn Y.V., Baranovski I.B., Majorova A.G.

Journal:

Zh. Neorg. Khimii 25, 216

Pub Year:

1980

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

166.00

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):