NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[SiF(N(C₂H₄O)₃)]

Name:

fluoro((2,2',2"-nitrilotris(ethanolato))-N,O,O',O")silicon

CAS Registry No:

62415547

Class:

fluoride, nitrogen, nitrogen ligand, oxygen, silicide

Citation:

Author Name(s):

Gray R.C., Hercules D.M.

Journal:

Inorg. Chem. 16, 1426

DOI:

Pub Year:

1977

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

102.60

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):